The candidate is expected to analyze the sensitivity of circuits under X-ray beams thanks to simulation models and compare them with experimental results. The goal will be to reproduce the experimental conditions, in particular the positioning and the interaction of the X-ray beam with respect to the circuit, possibly extending the analyses on the circuit (a few selected positions) and extract sensitivity maps extended to a larger area of the topology.

The candidate will then be able to use the developed models and flow in order to evaluate hardening techniques or fault attack countermeasures. This subtask will consist in using the multi-physics and multi-level methodology to study and optimize the layout/routing of the cells, and extract high-level models of the injected faults. This will be essential in order to evaluate techniques from the state of the art, and propose novel solutions against fault attacks.

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